Optional in-inline imaging includes integrated AFM or 3D profiler and a High-Magnification Microscope. The images are generated
automatically after the test (indentation, scratch , wear etc.) without removing the sample from the tool.
AFM - Scanning ranges from 50 x 50 x 3 µm up to 180 x 180 x
14 µm
3D profilometer - Scanning ranges from 10 x 10 x 10 µm up to
500 x 500 x 500 µm.
High Magnification microscope - With revolving head and
multiple objectives (up to 2000 X ).
Medium Magnification Microscope - For in-situ imaging and
precise positioning; both top and side views.
