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CETR Press Releases

January, 2008

UMT-3 Gains Wide Acceptance

After successful introduction of its high-load tester UMT-3M last year, CETR has been offering it for such diverse markets as tribology testing of lubricants and classical mechanical testing of materials.

March, 2007

20 Minutes with Dr. Norm Gitis

This article was published in the March 2007 issue of Tribology & Lubrication Technology, the official monthly magazine of the Society of Tribologists and Lubrication Engineers, a not-for-profit professional society headquartered in Park Ridge, Ill

September 2004

Abrasive Wear Task Group Begins Work on Chemical-Mechanical Polishing Standard

September 20, 2004

Universal Nano+Micro Materials Tester (UNMT)

CETR announced at the Japan Vacuum Show in Tokyo last week and is exhibiting at the Diskcon’04 in Santa Clara this week its newest test instrumentation.

Universal Nano+Micro Materials Tester (UNMT) for mechanical characterization of thin films, coatings and bulk materials for scratch, linear and rotary wear, adhesion and delamination, fatigue, friction, elastic and plastic deformations on the nano, micro and macro scales, including in vacuum and high temperatures.

Optional modules include an integrated nano-indentation head, atomic force and optical microscopes, micro-scratch/adhesion, micro-tensile/compression/fatigue, micro+macro tribometer (pin/ball-on-disc, reciprocation/fretting tester, block-on-ring), with close-loop servo-control of loads and displacements, simultaneous measurements of friction coefficient, wear depth, deformation/displacement, temperature, contact acoustic emission and electrical resistance.

The UNMT has been designed for biomedical, microelectronics, nano-films and other industries, as well as for fundamental materials research.

Figure 1. Loading-unloading curves for hardened (1) and fresh (2) Cu films on a Si wafer

Figure 2. AFM image of the nano-indent

Figure 3. Photo of the UNMT with integrated AFM and optical microscope

CETR has already received the first purchase order for the new instrument, which is available for immediate shipment.

For further information, please contact sales@cetr.com

September 1, 2004

CETR is proud and excited to introduce to the worldwide community of engineers and scientists in the fields of materials, thin films and tribology its new international branch in China.

CETR China Office has just been established in the dynamic city of Shanghai to support our customers in the fast-growing Chinese R&D instrumentation market. CETR’s micro/nano mechanics & tribology test equipment has been successfully utilized at leading research institutions such as Metal Research Institute and Chemical Physics Research Institute of the Chinese Academy of Sciences, Shanghai Institute of Microsystems and Information Technology, Surface Engineering Research Institute, etc., top-level universities like Tsinghua, Beijing Science and Technology, Mining, JiLin, etc., and major industrial companies like First Automobile Group, etc.

"Following the successful promotion of CETR products in China, we are now taking the next step by establishing the necessary infrastructure to fully support our current and future customers in China," commented Dr. Norm Gitis, President and CEO of CETR. "This shall further strengthen the broad and increasing demand for our leading-edge test equipment in the technology and research sectors across this impressively growing country."

In addition to CETR-brand products, the newly-established CETR China Office will utilize its well-developed marketing network in China for active promotion and services of complimentary products made by other companies in the fields of surface metrology, nano-instrumentation, nano-materials, semiconductor materials, thin film deposition. All products will be exhibited and promoted at all relevant conferences and exhibitions in China, Japan, and throughout Southeast Asia. CETR China will thus work hard to advance its business partners on the Chinese market.

The CETR China Office is managed by professionals with strong technical background in tribology, thin films, surface metrology, and scientific instrumentation, as well as strong marketing experience in both the US and Asia.

CETR looks forward to the continued success in serving customers worldwide in their test instrumentation needs.

Contact:

USA

Dr. Norm Gitis

1715 Dell Ave.

Campbell, CA 95008

Tel: 408-376-4040

Fax: 408-376-4050

Email: sales@cetr.com

China

Mr. Jun Xiao

Room 1005, Fu Xing Building

#655 Zhang Yang Road.

Shanghai, China 200120

Tel: 86-1369-1351-082

Email: ChinaOffice@cetr.com

CETR, September 1, 2003

Center for Tribology has shipped to the Chinese Academy of Sciences the first Micro-Tribometer with a ultra-high temperature chamber.

Within just a few months, development and production of a 850C chamber have been successfully completed. The chamber fits nicely inside the Micro-Tribometer (see the photo) and allows for friction, wear, scratch, adhesion and other materials tests, with simultaneous normal load, friction force and wear depth measurements, in a wide range of temperatures from room levels up to 850C.

The Micro-Tribometer is now offered with three levels of temperature chambers:

elevated-temperature chambers up to 150C,
high-temperature chambers up to 350C,
ultra-high temperature chambers up to 850C.

All these chambers are available as upgrades for CETR tribometers in the field, for all three types of lower-specimen motions, linear (ball/pin/plate-on-plate, piston-in-cylinder, and fretting tests), rotational around vertical axis (ball/pin/disc-on-disc tests), and rotational around horizontal axis (block-on-ring tests).

Detailed technical and pricing information can be requested from either sales@cetr.com

(for new customers) or service@cetr.com (for current users).

CETR, June 28, 2002

PadProbe™ for quantitative control of pad surface conditions and wear

CETR, April 9, 2002

Recent increase in the acts of bio- and chemical terrorism require development of new measures for dealing with the suspicious substances in the mail, which appears to be a convenient channel for delivery of harmful and contagious substances to government offices, companies, organizations, high-profile individuals.

One such measure is irradiation of mail started by the U.S. Postal Service in Washington. Total irradiation of the entire mail circulating through the United States may be an unreal objective in view of its high cost and damages it can cause to many items in the mail. Another measure is utilizing biological detection devices. These devices require preliminary opening the closed postal envelopes, are both too expensive and impractical due to violation of mail privacy.

The safest, fastest and most effective measure is extracting powder substances out of closed envelopes under safe conditions and without sacrificing mail privacy, testing the content of the envelopes for the powder presence, and analyzing a suspicious powder when and if detected. Such simple and safe in use apparatus MailShield(tm) has just been revealed by CETR at the First Bioterrorism Mobilization Conference in Seattle.

A mailroom worker just drops one or several (up to 5) letters of any conventional sizes into it, closes the door, after which fine powdered materials are extracted from the envelope without opening it and sucked into a powder detector. The measured data is automatically compared with a predetermined reference threshold. If particle count shows no increase over the threshold, the green light switches on and the door can be opened to remove the envelopes. If the threshold is exceeded, the apparatus will produce both sound and visible (red light) alarm signals, at the same time locking the door (to be opened with a special key by a supervisor). The inspection time is less than 10 seconds; up to 800 envelopes can be inspected within an hour. For higher mail volumes, an automated model will be provided. Extensive testing has confirmed efficiency and sensitivity of the MailShield(tm) apparatus for the typical mailrooms.

It is priced very affordably, at only $ 9,999 plus shipping, and is available for immediate shipment, including for a free-of-charge no-obligation 2-day trial.

Any questions or comments shall be addressed to:

________________________

Dr. Norm Gitis, President

408-376-4000 tel. secretary;

408-376-4041 tel. direct;

gitis@cetr.com e-mail

October 12, 2001

CETR’S PROPRIETARY SENSING TECHNOLOGY HAS BEEN NAMED ONE OF THE MOST IMPORTANT CMP METROLOGY DEVELOPMENTS OF 2001

Campbell, CA, October 12, 2001 - Center for Tribology announced today that it’s sensing technology has been recognized by Laredo Technologies as one of this year most important developments in the wafer planarization metrology.

At the Annual Symposium “Chemical Mechanical Polishing 2001”, organized by the American Vacuum Society in the Silicon Valley Convention Center, San Jose, October 11, 2001, the opening plenary talk by Tom Tucker, the industry pioneer and former President of Westech Systems, now President of the reputable market analysis firm Laredo Technologies, was titled “Key Issues related to CMP Market Segments”. In his presentation, Mr. Tucker named CETR’s proprietary Coefficient of Friction and Acoustic Emission Sensing Technology among the four major metrology developments of the CMP industry in 2001. He illustrated this statement with experimental data, showing effective applications of this technology for process control, consumables testing and copper/low-K integration.

Indeed, the CETR patented technology has been proven to work for CMP process monitoring. It can be utilized for adaptive process control and real-time adjustments of polishing parameters based on in-situ measurements of the coefficient of friction and high-frequency contact acoustic emission. It is effective for monitoring low-K material delaminations and micro-cracking during copper polishing, which is crucial for copper/low-K integration. It has already been implemented in a bench-top polisher used for functional testing of consumables, including pads, slurries, conditioners and retaining rings.

Dr. Norm Gitis, President and CEO of CETR, commented that indeed, this leading-edge technology can be utilized on both production CMP machines and laboratory CMP testers, with the latter ones promising to become the standard instrumentation at every semiconductor fab. The bench-top testers can be used for both fast process development and consumables testing, thus saving thousands of test wafers and preventing yield problems in CMP.

For more information, please contact:

Dr. Norm Gitis, gitis@cetr.com

November 10, 2000

CMP TESTER FOR PROCESS & MATERIALS DEVELOPMENT AND CONTROL

Our 7-year old Center is the world-largest provider of tribology (that is, friction and wear) test equipment and testing services. Our world-leading expertise in tribo-metrology has just been utilized in the latest product - CMP Tester. It is based on the latest technological advances and is the most precision and unique instrument of its kind. This automated instrument is a must for CMP users and suppliers as the means for understanding, optimization and control of CMP processes, machines and materials.

October 30, 1998

CENTER FOR TRIBOLOGY HAS BEEN ONE OF THE TWENTY FASTEST GROWING PRIVATE COMPANIES IN SILICON VALLEY FOR TWO CONSECUTIVE YEARS

Mountain View, CA, October 30, 1998

Once again, Center for Tribology is recognized by The Business Journal as one of The Twenty Fastest Growing Private Companies in Silicon Valley.

The ranking is based on the total revenue growth in preceding three years. In 1997 ranking, which was based on the growth from 1994 to 1996, CETR enjoyed a 1,287 percent increase in revenues and secured the position of # 1 Fastest Growing Private Company in Silicon Valley.

In the 1998 list, which is based on the total growth for 1995-1997, despite the slowdown in the disc drive industry, CETR has managed to remain in the top 20 companies and is ranked # 17.

This 2-year success is the best result for any private company in the HDD industry.

Center for Tribology started in October 1993, offering consulting services to disc drive manufacturers. In February 1994, it opened the door of its testing lab, which has since been the only independent lab in the industry, providing reliability and tribology testing for disc/tape drives and components. In January 1995 CETR started selling tribology testers, and within a year has become the largest in the world supplier of advanced computerized tribology test equipment.

Among its customers are who is who in the high-tech industry: Applied Materials, Fuji Electric, Fujitsu, Hewlett Packard, Hitachi, HMT Technology, IBM, Lucent, Maxtor, Mitsubishi, Quantum, Read-Rite, SAE Magnetics, Samsung Electronics, Seagate Technology, Toshiba, Western Digital, and many others.

CETR has been successfully diversifying its market by providing advanced test equipment, testing and consulting services to Fortune 500 companies including Castrol, Chevron, Corning, Dana, Dow Chemical, Du Pont, Ford, General Motors, 3M, etc.

For more information, please contact:

Dr. Norm Gitis, Center for Tribology, Inc.
1715 Dell Ave., Campbell, CA 95008
phone: 408-376-4041, fax: 408-376-4050,
e-mail: info@cetr.com

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Contact CETR to discuss your testing needs in detail, for more information and pricing or to set up an appointment to visit our lab in Northern California. You will surely be pleased with our wide expertise, unique equipment and friendly effective services.