•Predictive
Probing Summary
–Evaluated significant parameters for scrub mark
§Design parameters selected for field evaluation
–Characterized Cres to high resolution
•Customer
evaluation
–Several cards were evaluated at customer site
§Varied K, tip size and number of touchdowns
§Probed test wafers with production metal stack
§Cres monitored for all tests
–Objectives:
§Define design parameters for qualification
§Define probing recipe for qualification
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